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Stress techniques in advanced transistor architectures: bulk FinFETs and implant-free quantum well transistors
Publication:
Stress techniques in advanced transistor architectures: bulk FinFETs and implant-free quantum well transistors
Date
2012
Proceedings Paper
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24444.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Eneman, Geert
;
Witters, Liesbeth
;
Collaert, Nadine
;
Mitard, Jerome
;
Hellings, Geert
;
Yamaguchi, Shinpei
;
De Keersgieter, An
;
Hikavyy, Andriy
;
Vincent, Benjamin
;
Favia, Paola
;
Bender, Hugo
;
Veloso, Anabela
;
Chiarella, Thomas
;
Togo, Mitsuhiro
;
Loo, Roger
;
De Meyer, Kristin
;
Mercha, Abdelkarim
;
Horiguchi, Naoto
;
Thean, Aaron
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1924
since deposited on 2021-10-20
Acq. date: 2025-10-23
Citations
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Views
1924
since deposited on 2021-10-20
Acq. date: 2025-10-23
Citations