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Wafer-level nanoimprint lithography for single electron transistors

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dc.contributor.authorGlinsner, Thomas
dc.contributor.authorEibelhuber, Martin
dc.contributor.authorTreiblmayr, Dominik
dc.contributor.authorSchamberger, Barbara
dc.contributor.authorChouiki, M.
dc.contributor.authorLenk, Claudia
dc.contributor.authorKrivoshapkina, Y.
dc.contributor.authorHoffmann, M.
dc.contributor.authorLenk, Steve
dc.contributor.authorRangelow, Ivo
dc.contributor.authorChan, BT
dc.contributor.authorde Marneffe, Jean-Francois
dc.contributor.imecauthorChan, BT
dc.contributor.imecauthorde Marneffe, Jean-Francois
dc.contributor.orcidimecChan, BT::0000-0003-2890-0388
dc.date.accessioned2021-10-24T05:06:11Z
dc.date.available2021-10-24T05:06:11Z
dc.date.issued2017
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/28402
dc.source.conference16th International Conference on Nanoimprint and Nanoprint Technology - NNT
dc.source.conferencedate8/11/2017
dc.source.conferencelocationChangwon Korea
dc.title

Wafer-level nanoimprint lithography for single electron transistors

dc.typeMeeting abstract
dspace.entity.typePublication
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