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On the defect generation and low voltage extrapolation of QBD in SiO2/HfO2 stacks
Publication:
On the defect generation and low voltage extrapolation of QBD in SiO2/HfO2 stacks
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Date
2004
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Degraeve, Robin
;
Crupi, F.
;
Kwak, Dong Hwa
;
Groeseneken, Guido
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1950
since deposited on 2021-10-15
Acq. date: 2026-01-06
Citations
Metrics
Views
1950
since deposited on 2021-10-15
Acq. date: 2026-01-06
Citations