Publication:
Simulation of rReliability of nanoscale devices
Date
| dc.contributor.author | Bina, Markus | |
| dc.contributor.author | Triebl, O. | |
| dc.contributor.author | Karner, M. | |
| dc.contributor.author | Kaczer, Ben | |
| dc.contributor.author | Grasser, Tibor | |
| dc.contributor.imecauthor | Kaczer, Ben | |
| dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
| dc.date.accessioned | 2021-10-20T10:06:22Z | |
| dc.date.available | 2021-10-20T10:06:22Z | |
| dc.date.issued | 2012 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/20365 | |
| dc.source.conference | International Conference on Simulation of Semiconductor Processes and Devices - SISPAD | |
| dc.source.conferencedate | 5/09/2012 | |
| dc.source.conferencelocation | Denver, CO USA | |
| dc.title | Simulation of rReliability of nanoscale devices | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| Files | ||
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