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Comparison between analog performance of standard and strained triple-gate nFinFETs
Publication:
Comparison between analog performance of standard and strained triple-gate nFinFETs
Date
2008
Proceedings Paper
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15186.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Pavanello, M. A.
;
Martino, J. A.
;
Simoen, Eddy
;
Rooyackers, Rita
;
Collaert, Nadine
;
Claeys, Cor
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1876
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Citations
Metrics
Views
1876
since deposited on 2021-10-17
429
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations