Publication:

High-Throughput Nanopore-FET Array Readout IC With 5-MHz Bandwidth and Background Offset/Drift Calibration

Date

2023
Journal article
https://doi.org/10.1109/TCSI.2023.3311145
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dc.contributor.authorDas, Auro
dc.contributor.authorLin, Qiuyang
dc.contributor.authorSantermans, Sybren
dc.contributor.authorLiu, Lijun
dc.contributor.authorVan Hoof, Chris
dc.contributor.authorGielen, Georges
dc.contributor.authorVan Helleputte, Nick
dc.contributor.imecauthorLin, Qiuyang
dc.contributor.imecauthorSantermans, Sybren
dc.contributor.imecauthorLiu, Lijun
dc.contributor.imecauthorDas, Auro
dc.contributor.imecauthorVan Hoof, Chris
dc.contributor.imecauthorGielen, Georges
dc.contributor.imecauthorVan Helleputte, Nick
dc.contributor.orcidimecSantermans, Sybren::0000-0002-0843-102X
dc.contributor.orcidimecLiu, Lijun::0000-0002-3070-3204
dc.contributor.orcidimecLin, Qiuyang::0000-0002-7422-5793
dc.contributor.orcidimecDas, Auro::0000-0001-5061-3233
dc.contributor.orcidimecVan Hoof, Chris::0000-0002-4645-3326
dc.contributor.orcidimecVan Helleputte, Nick::0000-0002-7511-1923
dc.date.accessioned2023-12-14T09:10:57Z
dc.date.available2023-10-05T17:19:24Z
dc.date.available2023-12-14T09:10:57Z
dc.date.issued2023
dc.identifier.doi10.1109/TCSI.2023.3311145
dc.identifier.issn1549-8328
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/42650
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
dc.source.beginpage4323
dc.source.endpage4333
dc.source.issue11
dc.source.journalIEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS
dc.source.numberofpages11
dc.source.volume70
dc.subject.keywordsCMOS
dc.subject.keywordsNOISE
dc.title

High-Throughput Nanopore-FET Array Readout IC With 5-MHz Bandwidth and Background Offset/Drift Calibration

dc.typeJournal article
dspace.entity.typePublication
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