Publication:
A Low-Frequency Noise Study of Hot-Carrier Stressing Effects in Submicron Si p-MOSFETs
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2037 since deposited on 2021-09-29
2last month
Acq. date: 2026-04-25
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Statistics
Views
2037 since deposited on 2021-09-29
2last month
Acq. date: 2026-04-25
Citations