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A Low-Frequency Noise Study of Hot-Carrier Stressing Effects in Submicron Si p-MOSFETs
Publication:
A Low-Frequency Noise Study of Hot-Carrier Stressing Effects in Submicron Si p-MOSFETs
Date
1995
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Vasina, Petr
;
Sikula, J.
;
Simoen, Eddy
;
Claeys, C.
Journal
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2032
since deposited on 2021-09-29
Acq. date: 2025-10-23
Citations
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Views
2032
since deposited on 2021-09-29
Acq. date: 2025-10-23
Citations