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Articles
Excess carrier density variations in test structures for photoconductance-based contact recombination current measurements
Publication:
Excess carrier density variations in test structures for photoconductance-based contact recombination current measurements
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Date
2015
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Deckers, Jan
;
Debucquoy, Maarten
;
Gordon, Ivan
;
Mertens, Robert
;
Poortmans, Jef
Journal
IEEE Journal of Photovoltaics
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1892
since deposited on 2021-10-22
Acq. date: 2025-12-11
Citations
Metrics
Views
1892
since deposited on 2021-10-22
Acq. date: 2025-12-11
Citations