Publication:
l/f Noise performance of n-MOSFETs with Hf-based gate dielectrics
Date
| dc.contributor.author | Srinivasan, P. | |
| dc.contributor.author | Simoen, Eddy | |
| dc.contributor.author | Pantisano, Luigi | |
| dc.contributor.author | Claeys, Cor | |
| dc.contributor.author | Misra, D. | |
| dc.contributor.imecauthor | Simoen, Eddy | |
| dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
| dc.date.accessioned | 2021-10-16T05:21:54Z | |
| dc.date.available | 2021-10-16T05:21:54Z | |
| dc.date.issued | 2005 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/11260 | |
| dc.source.beginpage | 151 | |
| dc.source.conference | Advanced Gate Stack, Source/Drain and Channel Engineering for Si-Based CMOS: New Materials, Processes and Equipment | |
| dc.source.conferencedate | 16/05/2005 | |
| dc.source.conferencelocation | Quebec Canada | |
| dc.source.endpage | 160 | |
| dc.title | l/f Noise performance of n-MOSFETs with Hf-based gate dielectrics | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
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