Publication:

ESD protection for sub-45nm MugFET technology

Date

2007-07
Proceedings Paper
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dc.contributor.authorNatarajan Iyer, Mahadeva
dc.contributor.authorThijs, Steven
dc.contributor.authorTremouilles, David
dc.contributor.authorLinten, Dimitri
dc.contributor.authorCollaert, Nadine
dc.contributor.authorJurczak, Gosia
dc.contributor.authorGroeseneken, Guido
dc.contributor.imecauthorThijs, Steven
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.imecauthorJurczak, Gosia
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecThijs, Steven::0000-0003-2889-8345
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.date.accessioned2021-10-16T18:07:39Z
dc.date.available2021-10-16T18:07:39Z
dc.date.embargo9999-12-31
dc.date.issued2007-07
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/12610
dc.source.beginpage159
dc.source.conference14th IEEE International Symposium on the Physical and Failuire Analysis of Integrated Circuits - IPFA
dc.source.conferencedate11/07/2007
dc.source.conferencelocationBangalore India
dc.source.endpage164
dc.title

ESD protection for sub-45nm MugFET technology

dc.typeProceedings paper
dspace.entity.typePublication
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