Publication:
White beam synchroton x-ray topography and x-ray diffraction measurements of epitaxial lateral overgrowth of GaN
Date
| dc.contributor.author | Chen, W. M. | |
| dc.contributor.author | McNally, P. J. | |
| dc.contributor.author | Jacobs, Koen | |
| dc.contributor.author | Tuomi, T. | |
| dc.contributor.author | Danilewsky, A. N. | |
| dc.contributor.author | Lowney, D. | |
| dc.contributor.author | Kanatharana, J. | |
| dc.contributor.author | Knuuttila, L. | |
| dc.contributor.author | Riikonen, J. | |
| dc.date.accessioned | 2021-10-14T16:41:26Z | |
| dc.date.available | 2021-10-14T16:41:26Z | |
| dc.date.issued | 2001 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/5137 | |
| dc.source.conference | MRS Fall Meeting 2001: Symposium I: GaN and related alloys; November 26-30, 2001; Boston, MA, USA. | |
| dc.source.conferencelocation | ||
| dc.title | White beam synchroton x-ray topography and x-ray diffraction measurements of epitaxial lateral overgrowth of GaN | |
| dc.type | Oral presentation | |
| dspace.entity.type | Publication | |
| Files | ||
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