The Prospect of Spatially Accurate Reconstructed Atom Probe Data Using Experimental Emitter Shapes

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Author(s)

Op de Beeck, Jonathan

;

Scheerder, Jeroen

;

Geiser, Brian P.

;

Bunton, Joseph H.

;

Ulfig, Robert M.

;

Larson, David J.

;

van der Heide, Paul

;

Vandervorst, Wilfried

;

Fleischmann, Claudia

Journal

MICROSCOPY AND MICROANALYSIS

Metrics

1421 since deposited on 2022-04-14

Acq. date: 2025-10-27