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Incidence Angle Effect: Validation of New Measurement Methods for IEC 61853-2

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dc.contributor.authorPravettoni, Mauro
dc.contributor.authorSaw, Min Hsian
dc.contributor.authorBardizza, Giorgio
dc.contributor.authorBellenda, Giovanni
dc.contributor.authorCouderc, Romain
dc.contributor.authorFriesen, Gabi
dc.contributor.authorHerrmann, Werner
dc.contributor.authorLeow, Shin Woei
dc.contributor.authorRiechelmann, Stefan
dc.contributor.authorValoti, Flavio
dc.contributor.authorvan Der Heide, Arvid
dc.contributor.authorWeinrich, Frank
dc.contributor.authorWinter, Stefan
dc.contributor.imecauthorvan Der Heide, Arvid
dc.contributor.orcidimecvan der Heide, Arvid::0000-0002-7589-4526
dc.date.accessioned2024-09-24T17:00:41Z
dc.date.available2024-09-24T17:00:41Z
dc.date.issued2025
dc.description.wosFundingTextThe authors would like to acknowledge SERIS for having provided the test samples. SERIS is a research institute at the National University of Singapore (NUS) and is supported by NUS, the National Research Foundation Singapore (NRF), the Energy Market Authority of Singapore (EMA), and the Singapore Economic Development Board (EDB).
dc.identifier.doi10.1002/pip.3850
dc.identifier.issn1062-7995
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/44565
dc.publisherWILEY
dc.source.journalPROGRESS IN PHOTOVOLTAICS
dc.source.numberofpages11
dc.subject.keywordsLOSSES
dc.title

Incidence Angle Effect: Validation of New Measurement Methods for IEC 61853-2

dc.typeJournal article
dspace.entity.typePublication
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