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Comparison of micro-electronic test structures for noise measurement verification
Publication:
Comparison of micro-electronic test structures for noise measurement verification
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Date
1999
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Van Den Bosch, Sven
;
De Ketelaere, Wim
;
Martens, Luc
;
De Vos, Joeri
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Acq. date: 2025-12-10
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Views
1847
since deposited on 2021-10-14
4
last month
2
last week
Acq. date: 2025-12-10
Citations