Publication:
Superior reliability and reduced time-dependent variability in high-mobility SiGe channel pMOSFETs for VLSI logic applications
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1846 since deposited on 2021-10-20
1last month
Acq. date: 2026-04-06
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Statistics
Views
1846 since deposited on 2021-10-20
1last month
Acq. date: 2026-04-06
Citations