Publication:

Sensitivity study of the parasitics of advanced finFETs

Date

2018
Meeting abstract
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dc.contributor.authorSchuddinck, Pieter
dc.contributor.authorIverson, Ralph
dc.contributor.authorAnnamalai, Senthil
dc.contributor.authorYakimets, Dmitry
dc.contributor.authorParvais, Bertrand
dc.contributor.authorSundaresan, Krishnakumar
dc.contributor.authorMocuta, Anda
dc.contributor.imecauthorSchuddinck, Pieter
dc.contributor.imecauthorYakimets, Dmitry
dc.contributor.imecauthorParvais, Bertrand
dc.contributor.orcidimecParvais, Bertrand::0000-0003-0769-7069
dc.contributor.orcidimecSchuddinck, Pieter::0000-0003-1893-3135
dc.contributor.orcidimecYakimets, Dmitry::0000-0002-0772-7398
dc.date.accessioned2021-10-26T03:30:45Z
dc.date.available2021-10-26T03:30:45Z
dc.date.issued2018
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/31746
dc.source.conferenceSNUG (Synopsys User Group) Europe 2018
dc.source.conferencedate11/06/2018
dc.source.conferencelocationMünchen Germany
dc.title

Sensitivity study of the parasitics of advanced finFETs

dc.typeMeeting abstract
dspace.entity.typePublication
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