Publication:

Mobility extraction using RFCV for 80nm MOSFET with 1nm EOT HfSiON/TiN

Date

2007

Journal article

Simple item page Full metadata Statistics

Author(s)

San Andres Serrano, Enrique

;

Pantisano, Luigi

;

;

Trojman, Lionel

;

Ferain, Isabelle

;

Toledano-Luque, M.

;

;

Groeseneken, Guido

;

De Gendt, Stefan

;

Journal

Microelectronic Engineering

Statistics

1941 since deposited on 2021-10-16

3last month

Acq. date: 2026-02-24