Publication:
Correlation between charge Injection and trapping in SiO2/HfO2 gate stacks
Date
| dc.contributor.author | Cartier, Eduard | |
| dc.contributor.author | Pantisano, Luigi | |
| dc.contributor.author | Kerber, Andreas | |
| dc.contributor.author | Groeseneken, Guido | |
| dc.contributor.imecauthor | Groeseneken, Guido | |
| dc.date.accessioned | 2021-10-15T04:06:32Z | |
| dc.date.available | 2021-10-15T04:06:32Z | |
| dc.date.issued | 2003 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/7288 | |
| dc.source.conference | Insulating Films on Semiconductors Conference - INFOS. 13th Bi-Annual Conference | |
| dc.source.conferencedate | 18/06/2003 | |
| dc.source.conferencelocation | Barcelona Spain | |
| dc.title | Correlation between charge Injection and trapping in SiO2/HfO2 gate stacks | |
| dc.type | Oral presentation | |
| dspace.entity.type | Publication | |
| Files | ||
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