Publication:

Temperature profile measurement and failure characterization of ESD protection devices using spectroscopic photon emission microscopy and Raman spectroscopy

Date

1999
Proceedings Paper
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dc.contributor.authorRasras, Mahmoud
dc.contributor.authorDe Wolf, Ingrid
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorChen, Jian
dc.contributor.authorBock, Karlheinz
dc.contributor.authorMaes, Herman
dc.contributor.imecauthorDe Wolf, Ingrid
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecDe Wolf, Ingrid::0000-0003-3822-5953
dc.date.accessioned2021-10-14T11:35:15Z
dc.date.available2021-10-14T11:35:15Z
dc.date.embargo9999-12-31
dc.date.issued1999
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/3771
dc.source.beginpage69
dc.source.conferenceConference Proceedings from the 25th International Symposium for Testing and Failure Analysis - ISTFA
dc.source.conferencedate14/11/1999
dc.source.conferencelocationSanta Clara, CA USA
dc.source.endpage76
dc.title

Temperature profile measurement and failure characterization of ESD protection devices using spectroscopic photon emission microscopy and Raman spectroscopy

dc.typeProceedings paper
dspace.entity.typePublication
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