Impact of fast neutron irradiation on the silicon p-n junction leakage and role of the diffusion reverse current

dc.contributor.author	Czerwinski, A.
dc.contributor.author	Katcki, J.
dc.contributor.author	Ratajczak, J.
dc.contributor.author	Simoen, Eddy
dc.contributor.author	Poyai, Amporn
dc.contributor.author	Claeys, Cor
dc.contributor.author	Ohyama, Hidenori
dc.contributor.imecauthor	Simoen, Eddy
dc.contributor.orcidimec	Simoen, Eddy::0000-0002-5218-4046
dc.date.accessioned	2021-10-14T16:44:18Z
dc.date.available	2021-10-14T16:44:18Z
dc.date.issued	2001
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/5175
dc.source.conference	Symposium B of the E-MRS Spring Meeting 2001: Defect Engineering of Advanced Semiconductor Devices; June 5-8, 2001; Strasbourg,
dc.source.conferencelocation
dc.title	Impact of fast neutron irradiation on the silicon p-n junction leakage and role of the diffusion reverse current
dc.type	Oral presentation
dspace.entity.type	Publication
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