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Reliability by design approach for life time prediction of electronic systems,
Publication:
Reliability by design approach for life time prediction of electronic systems,
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Date
2020
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Vandevelde, Bart
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1959
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Acq. date: 2025-12-15
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Views
1959
since deposited on 2021-10-29
1
last month
1
last week
Acq. date: 2025-12-15
Citations