Publication:
Two-dimensional carrier profiling with sub-nm resolution using SSRM: from basic concept to TCAD calibration and device tuning
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1964 since deposited on 2021-10-17
2last month
1last week
Acq. date: 2026-01-08
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Metrics
Views
1964 since deposited on 2021-10-17
2last month
1last week
Acq. date: 2026-01-08
Citations