Publication:
Investigation of the threshold voltage difference between partially-depleted SOI and bulk CMOS transistors
Date
| dc.contributor.author | van Meer, Hans | |
| dc.contributor.author | Lyu, Jeong-ho | |
| dc.contributor.author | Kubicek, Stefan | |
| dc.contributor.author | De Meyer, Kristin | |
| dc.contributor.imecauthor | Kubicek, Stefan | |
| dc.contributor.imecauthor | De Meyer, Kristin | |
| dc.date.accessioned | 2021-10-14T11:48:17Z | |
| dc.date.available | 2021-10-14T11:48:17Z | |
| dc.date.issued | 1999 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/3937 | |
| dc.source.beginpage | 372 | |
| dc.source.conference | ESSDERC'99 - Proceedings of the 29th European Solid-State Device Research Conference; 13-15 September 1999; Leuven, Belgium. | |
| dc.source.conferencelocation | ||
| dc.source.endpage | 375 | |
| dc.title | Investigation of the threshold voltage difference between partially-depleted SOI and bulk CMOS transistors | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| Files | ||
| Publication available in collections: |