Publication:
Analysis of irradiation induced defects in silicon devices
Date
| dc.contributor.author | Vegh, Gerzson | |
| dc.contributor.author | Simoen, Eddy | |
| dc.contributor.author | Vanhellemont, Jan | |
| dc.contributor.author | Claeys, C. | |
| dc.contributor.imecauthor | Simoen, Eddy | |
| dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
| dc.date.accessioned | 2021-09-29T13:23:34Z | |
| dc.date.available | 2021-09-29T13:23:34Z | |
| dc.date.issued | 1995 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/985 | |
| dc.source.beginpage | 329 | |
| dc.source.conference | RELECTRONIC '95. 9th Symposium on Quality and Reliability in Electronics; 16-18 Oct. 1995; Budapest, Hungary. | |
| dc.source.conferencelocation | ||
| dc.source.endpage | 34 | |
| dc.title | Analysis of irradiation induced defects in silicon devices | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| Files | ||
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