Publication:
Evanescent Coupling Degradation from Particle-Induced Voids in III-V/Si Micro-transfer-printed Integrated Lasers
| cris.virtual.department | #PLACEHOLDER_PARENT_METADATA_VALUE# | |
| cris.virtual.department | #PLACEHOLDER_PARENT_METADATA_VALUE# | |
| cris.virtual.department | #PLACEHOLDER_PARENT_METADATA_VALUE# | |
| cris.virtual.department | #PLACEHOLDER_PARENT_METADATA_VALUE# | |
| cris.virtual.orcid | 0000-0001-6608-9990 | |
| cris.virtual.orcid | 0000-0001-5655-3470 | |
| cris.virtual.orcid | 0000-0002-4667-5092 | |
| cris.virtual.orcid | 0000-0001-9624-3928 | |
| cris.virtualsource.department | 7897aa7a-0c43-4929-b5ef-9f5606dd37c6 | |
| cris.virtualsource.department | 269e99b3-e865-45a6-be00-65dcb446d66d | |
| cris.virtualsource.department | b32be2a6-49e5-4859-8aac-84fd4f5bec8e | |
| cris.virtualsource.department | 1661a067-e09d-41e0-8dfc-834fda2c7169 | |
| cris.virtualsource.orcid | 7897aa7a-0c43-4929-b5ef-9f5606dd37c6 | |
| cris.virtualsource.orcid | 269e99b3-e865-45a6-be00-65dcb446d66d | |
| cris.virtualsource.orcid | b32be2a6-49e5-4859-8aac-84fd4f5bec8e | |
| cris.virtualsource.orcid | 1661a067-e09d-41e0-8dfc-834fda2c7169 | |
| dc.contributor.author | Liu, Yang | |
| dc.contributor.author | Zhang, Jing | |
| dc.contributor.author | Delli, Evangelia | |
| dc.contributor.author | Roelkens, Gunther | |
| dc.date.accessioned | 2026-09-07T09:36:02Z | |
| dc.date.available | 2026-09-07T09:36:02Z | |
| dc.date.createdwos | 2026 | |
| dc.date.issued | 2026 | |
| dc.description.abstract | Void-induced evanescent coupling degradation in InP-on-Si lasers is analyzed. A location-dependent analysis reveals 100nm particles at the tapers cause a 0.913 dB loss (vs. 0.058 dB at mid-coupon). Guidelines for void-tolerant evanescent interfaces on the SiPh platform are proposed. | |
| dc.description.wosFundingText | This work was supported by the PhotonixFAB project (101111896) and the Dutch Growth Fund PhotonDelta project. | |
| dc.identifier.doi | 10.1117/12.3078863 | |
| dc.identifier.isbn | 978-1-5106-9697-6 | |
| dc.identifier.issn | 0277-786X | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/60221 | |
| dc.language.iso | eng | |
| dc.provenance.editstepuser | greet.vanhoof@imec.be | |
| dc.publisher | SPIE-INT SOC OPTICAL ENGINEERING | |
| dc.source.beginpage | 1389006 | |
| dc.source.conference | Physics and Simulation of Optoelectronic Devices XXXIV | |
| dc.source.conferencedate | 2026-01-16 | |
| dc.source.conferencelocation | San Francisco | |
| dc.source.journal | PHYSICS AND SIMULATION OF OPTOELECTRONIC DEVICES XXXIV | |
| dc.source.numberofpages | 4 | |
| dc.title | Evanescent Coupling Degradation from Particle-Induced Voids in III-V/Si Micro-transfer-printed Integrated Lasers | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| imec.internal.crawledAt | 2026-07-14 | |
| imec.internal.source | crawler | |
| imec.internal.wosCreatedAt | 2026-07-14 | |
| Files | Original bundle
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| Publication available in collections: |