Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Conference contributions
Distinction between silicon and oxide traps using single-trap spectroscopy
Publication:
Distinction between silicon and oxide traps using single-trap spectroscopy
Date
2014
Meeting abstract
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Fang, Wen
;
Simoen, Eddy
;
Aoulaiche, Marc
;
Luo, Jun
;
Zhao, Chao
;
Claeys, Cor
Journal
Abstract
Description
Metrics
Views
1898
since deposited on 2021-10-22
415
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations
Metrics
Views
1898
since deposited on 2021-10-22
415
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations