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Electrical characterization of low-k dielectrics and copper interconnects
Publication:
Electrical characterization of low-k dielectrics and copper interconnects
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Date
2003-06
Dissertation
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8654.pdf
1.65 MB
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
De Roest, David
Journal
Abstract
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1
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Acq. date: 2025-12-15
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1963
since deposited on 2021-10-15
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Acq. date: 2025-12-15
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Downloads
1
since deposited on 2021-10-15
Acq. date: 2025-12-15
Views
1963
since deposited on 2021-10-15
2
last month
Acq. date: 2025-12-15
Citations