Publication:
Border traps in InGaAs nMOSFETs assessed by low-frequency noise
Date
| dc.contributor.author | Scarpino, Mercedes | |
| dc.contributor.author | Gupta, Somya | |
| dc.contributor.author | Lin, Dennis | |
| dc.contributor.author | Alian, AliReza | |
| dc.contributor.author | Crupi, Felice | |
| dc.contributor.author | Collaert, Nadine | |
| dc.contributor.author | Thean, Aaron | |
| dc.contributor.author | Simoen, Eddy | |
| dc.contributor.imecauthor | Lin, Dennis | |
| dc.contributor.imecauthor | Alian, AliReza | |
| dc.contributor.imecauthor | Collaert, Nadine | |
| dc.contributor.imecauthor | Thean, Aaron | |
| dc.contributor.imecauthor | Simoen, Eddy | |
| dc.contributor.orcidimec | Collaert, Nadine::0000-0002-8062-3165 | |
| dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
| dc.date.accessioned | 2021-10-22T05:32:02Z | |
| dc.date.available | 2021-10-22T05:32:02Z | |
| dc.date.issued | 2014 | |
| dc.identifier.issn | 0741-3106 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/24487 | |
| dc.identifier.url | http://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=6819797&queryText%3DBorder+traps+in+InGaAs+nMOSFETs+assessed+by+l | |
| dc.source.beginpage | 720 | |
| dc.source.endpage | 722 | |
| dc.source.issue | 7 | |
| dc.source.journal | IEEE Electron Device Letters | |
| dc.source.volume | 35 | |
| dc.title | Border traps in InGaAs nMOSFETs assessed by low-frequency noise | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
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