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High-throughput multi-beam SEM: quantitative analysis of imaging capabilities at imec-N10 logic node
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High-throughput multi-beam SEM: quantitative analysis of imaging capabilities at imec-N10 logic node
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Date
2017
Proceedings Paper
https://doi.org/10.1117/12.2257980
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36892.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Neumann, J.T.
;
Garbowski, T.
;
Högele, W.
;
Korb, T.
;
Halder, Sandip
;
Leray, Philippe
;
Garreis, R.
;
le Maire, M.
;
Zeidler, D.
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1
since deposited on 2021-10-24
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1899
since deposited on 2021-10-24
1
last month
Acq. date: 2025-12-11
Citations