Nanoscale 3D characterisation of soft organic material using conductive scanning probe tomography

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39704.pdf 5.81 MB

Author(s)

Chintala, Ravi Chandra

;

Wood, Sebastian

;

Blakesley, James C.

;

;

Celano, Umberto

;

Paredis, Kristof

;

Vandervorst, Wilfried

;

Castro, Fernando A.

Journal

AIP Advances

Metrics

1913 since deposited on 2021-10-27

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Acq. date: 2025-10-24