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Identification of key factors to reduce stress induced during 3D IC's assembly
Publication:
Identification of key factors to reduce stress induced during 3D IC's assembly
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Date
2016
Proceedings Paper
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33608.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Lofrano, Melina
;
Gonzalez, Mario
;
Cherman, Vladimir
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Abstract
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1887
since deposited on 2021-10-23
Acq. date: 2025-12-16
Citations
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Views
1887
since deposited on 2021-10-23
Acq. date: 2025-12-16
Citations