Quantitative analysis of TM lateral leakage in foundry fabricated silicon rib waveguides

dc.contributor.author	Hope, A.
dc.contributor.author	Nguyen, T.G.
dc.contributor.author	Mitchell, A.
dc.contributor.author	Bogaerts, Wim
dc.contributor.imecauthor	Bogaerts, Wim
dc.contributor.orcidimec	Bogaerts, Wim::0000-0003-1112-8950
dc.date.accessioned	2021-10-23T11:18:46Z
dc.date.available	2021-10-23T11:18:46Z
dc.date.embargo	9999-12-31
dc.date.issued	2016
dc.identifier.issn	1041-1135
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/26734
dc.identifier.url	http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7328266
dc.source.beginpage	493
dc.source.endpage	496
dc.source.issue	4
dc.source.journal	IEEE Photonics Technology Letters
dc.source.volume	28
dc.title	Quantitative analysis of TM lateral leakage in foundry fabricated silicon rib waveguides
dc.type	Journal article
dspace.entity.type	Publication
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