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A TDI test imager in embedded CCD in CMOS technology
Publication:
A TDI test imager in embedded CCD in CMOS technology
Date
2013
Presentation
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28751.pdf
1.75 MB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Ercan, Alper
;
Robbelein, Jo
;
De Munck, Koen
;
Minoglou, Kiki
;
Lauwers, Anne
;
Haspeslagh, Luc
;
De Moor, Piet
Journal
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2049
since deposited on 2021-10-21
Acq. date: 2025-10-23
Citations
Metrics
Views
2049
since deposited on 2021-10-21
Acq. date: 2025-10-23
Citations