Publication:
Measuring nonlinear devices to retrieve good system-level models
Date
| dc.contributor.author | De Locht, Ludwig | |
| dc.contributor.author | Vandersteen, Gerd | |
| dc.contributor.author | Rolain, Yves | |
| dc.contributor.author | Rabijns, Daan | |
| dc.contributor.imecauthor | Vandersteen, Gerd | |
| dc.date.accessioned | 2021-10-16T01:08:31Z | |
| dc.date.available | 2021-10-16T01:08:31Z | |
| dc.date.issued | 2005 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/10302 | |
| dc.source.conference | 66th ARFTG Conference | |
| dc.source.conferencedate | 1/12/2005 | |
| dc.source.conferencelocation | Washington D.C. USA | |
| dc.title | Measuring nonlinear devices to retrieve good system-level models | |
| dc.type | Oral presentation | |
| dspace.entity.type | Publication | |
| Files | ||
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