Publication:

Interface analysis and intrinsic thermal stability of MoOx hole-selective contact for silicon heterojunction solar cells

Date

2019
Journal article
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dc.contributor.authorCho, Jinyoun
dc.contributor.authorNawal, Neerja
dc.contributor.authorHadipour, Afshin
dc.contributor.authorRecaman Payo, Maria
dc.contributor.authorvan der Heide, Arvid
dc.contributor.authorSivaramakrishnan Radhakrishnan, Hariharsudan
dc.contributor.authorDebucquoy, Maarten
dc.contributor.authorGordon, Ivan
dc.contributor.authorSzlufcik, Jozef
dc.contributor.authorPoortmans, Jef
dc.contributor.imecauthorCho, Jinyoun
dc.contributor.imecauthorHadipour, Afshin
dc.contributor.imecauthorRecaman Payo, Maria
dc.contributor.imecauthorvan der Heide, Arvid
dc.contributor.imecauthorSivaramakrishnan Radhakrishnan, Hariharsudan
dc.contributor.imecauthorDebucquoy, Maarten
dc.contributor.imecauthorGordon, Ivan
dc.contributor.imecauthorSzlufcik, Jozef
dc.contributor.imecauthorPoortmans, Jef
dc.contributor.orcidimecvan der Heide, Arvid::0000-0002-7589-4526
dc.contributor.orcidimecSivaramakrishnan Radhakrishnan, Hariharsudan::0000-0003-1963-273X
dc.contributor.orcidimecDebucquoy, Maarten::0000-0001-5980-188X
dc.contributor.orcidimecGordon, Ivan::0000-0002-0713-8403
dc.contributor.orcidimecPoortmans, Jef::0000-0003-2077-2545
dc.date.accessioned2021-10-27T08:03:07Z
dc.date.available2021-10-27T08:03:07Z
dc.date.issued2019
dc.identifier.issn0927-0248
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/32710
dc.identifier.urlhttps://doi.org/10.1016/j.solmat.2019.110074
dc.source.beginpage110074
dc.source.journalSolar Energy Materials and Solar Cells
dc.source.volume201
dc.title

Interface analysis and intrinsic thermal stability of MoOx hole-selective contact for silicon heterojunction solar cells

dc.typeJournal article
dspace.entity.typePublication
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