Publication:

OTS Physics-based Screening for Environment-friendly Selector Materials

Date

2022
Proceedings Paper
https://doi.org/10.1109/IEDM45625.2022.10019445
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dc.contributor.authorMatsubayashi, Daisuke
dc.contributor.authorClima, Sergiu
dc.contributor.authorRavsher, T.
dc.contributor.authorGarbin, Daniele
dc.contributor.authorDelhougne, Romain
dc.contributor.authorKar, Gouri Sankar
dc.contributor.authorPourtois, Geoffrey
dc.contributor.imecauthorMatsubayashi, Daisuke
dc.contributor.imecauthorClima, Sergiu
dc.contributor.imecauthorGarbin, Daniele
dc.contributor.imecauthorDelhougne, Romain
dc.contributor.imecauthorKar, Gouri Sankar
dc.contributor.imecauthorPourtois, Geoffrey
dc.contributor.orcidimecClima, Sergiu::0000-0002-4044-9975
dc.contributor.orcidimecGarbin, Daniele::0000-0002-5884-1043
dc.contributor.orcidimecPourtois, Geoffrey::0000-0003-2597-8534
dc.date.accessioned2023-06-01T15:29:16Z
dc.date.available2023-05-25T20:20:22Z
dc.date.available2023-06-01T15:29:16Z
dc.date.embargo2023-01-23
dc.date.issued2022
dc.identifier.doi10.1109/IEDM45625.2022.10019445
dc.identifier.eisbn978-1-6654-8959-1
dc.identifier.issn2380-9248
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/41627
dc.publisherIEEE
dc.source.conferenceInternational Electron Devices Meeting (IEDM)
dc.source.conferencedateDEC 03-07, 2022
dc.source.conferencelocationSan Francisco
dc.source.journalna
dc.source.numberofpages4
dc.title

OTS Physics-based Screening for Environment-friendly Selector Materials

dc.typeProceedings paper
dspace.entity.typePublication
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