Publication:

Total ionizing dose effects on ultra thin buried oxide floating body memories

Date

2012-04
Proceedings Paper
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dc.contributor.authorMahatme, Nihaar
dc.contributor.authorSchrimpf, Ronald
dc.contributor.authorReed, Robert
dc.contributor.authorBhuva, B.L.
dc.contributor.authorGriffoni, Alessio
dc.contributor.authorSimoen, Eddy
dc.contributor.authorAoulaiche, Marc
dc.contributor.authorLinten, Dimitri
dc.contributor.authorJurczak, Gosia
dc.contributor.authorGroeseneken, Guido
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorJurczak, Gosia
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.date.accessioned2021-10-20T13:04:16Z
dc.date.available2021-10-20T13:04:16Z
dc.date.embargo9999-12-31
dc.date.issued2012-04
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/21075
dc.source.beginpageMY-3
dc.source.conferenceIEEE International Reliability Physics Symposium - IRPS
dc.source.conferencedate15/04/2012
dc.source.conferencelocationAnaheim, CA USA
dc.title

Total ionizing dose effects on ultra thin buried oxide floating body memories

dc.typeProceedings paper
dspace.entity.typePublication
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