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Articles
Techniques for reducing the number of decisions and backtracks in combinational test generation
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Techniques for reducing the number of decisions and backtracks in combinational test generation
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Date
1998
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2507.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Sahraoui, Z.
;
Catthoor, Francky
;
Six, Paul
;
De Man, Hugo
Journal
Journal of Electronic Testing: Theory and Applications
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1915
since deposited on 2021-10-01
Acq. date: 2026-01-11
Citations
Metrics
Views
1915
since deposited on 2021-10-01
Acq. date: 2026-01-11
Citations