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Techniques for reducing the number of decisions and backtracks in combinational test generation
Publication:
Techniques for reducing the number of decisions and backtracks in combinational test generation
Date
1998
Journal article
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Sahraoui, Z.
;
Catthoor, Francky
;
Six, Paul
;
De Man, Hugo
Journal
Journal of Electronic Testing: Theory and Applications
Abstract
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1913
since deposited on 2021-10-01
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Acq. date: 2025-11-01
Citations
Metrics
Views
1913
since deposited on 2021-10-01
2
last week
Acq. date: 2025-11-01
Citations