Publication:

Self-heating-aware CMOS reliability characterization using degradation maps

Date

2018
Proceedings Paper
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dc.contributor.authorBury, Erik
dc.contributor.authorVaisman Chasin, Adrian
dc.contributor.authorKaczer, Ben
dc.contributor.authorChuang, Kent
dc.contributor.authorFranco, Jacopo
dc.contributor.authorSimicic, Marko
dc.contributor.authorWeckx, Pieter
dc.contributor.authorLinten, Dimitri
dc.contributor.imecauthorBury, Erik
dc.contributor.imecauthorVaisman Chasin, Adrian
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorChuang, Kent
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorSimicic, Marko
dc.contributor.imecauthorWeckx, Pieter
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.orcidimecBury, Erik::0000-0002-5847-3949
dc.contributor.orcidimecVaisman Chasin, Adrian::0000-0002-9940-0260
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecSimicic, Marko::0000-0002-3623-1842
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.date.accessioned2021-10-25T16:59:33Z
dc.date.available2021-10-25T16:59:33Z
dc.date.embargo9999-12-31
dc.date.issued2018
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/30343
dc.identifier.urlhttps://ieeexplore.ieee.org/document/8353541/
dc.source.beginpage2A.3-1
dc.source.conferenceIEEE International Reliability Physics Symposium - IRPS
dc.source.conferencedate11/03/2018
dc.source.conferencelocationSan Francisco, CA USA
dc.source.endpage2A.3-6
dc.title

Self-heating-aware CMOS reliability characterization using degradation maps

dc.typeProceedings paper
dspace.entity.typePublication
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