Publication:
Electrical stress on irradiated thin gate oxide partially depleted SOI nMOSFETs
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1925 since deposited on 2021-10-16
4last month
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Acq. date: 2025-12-08
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1925 since deposited on 2021-10-16
4last month
2last week
Acq. date: 2025-12-08
Citations