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Growth rate of IMC in the binary sytems of Co/Sn and Cu/Sn

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dc.contributor.authorNagano, Fuya
dc.contributor.authorKajihara, Masanori
dc.contributor.authorDerakhshandeh, Jaber
dc.contributor.authorHou, Lin
dc.contributor.authorVan De Peer, Myriam
dc.contributor.authorDe Preter, Inge
dc.contributor.authorHoushmand Sharifi, Shamin
dc.contributor.authorRebibis, Kenneth June
dc.contributor.authorMiller, Andy
dc.contributor.authorBeyne, Eric
dc.contributor.authorBeyer, Gerald
dc.contributor.imecauthorNagano, Fuya
dc.contributor.imecauthorDerakhshandeh, Jaber
dc.contributor.imecauthorHou, Lin
dc.contributor.imecauthorVan De Peer, Myriam
dc.contributor.imecauthorDe Preter, Inge
dc.contributor.imecauthorHoushmand Sharifi, Shamin
dc.contributor.imecauthorRebibis, Kenneth June
dc.contributor.imecauthorMiller, Andy
dc.contributor.imecauthorBeyne, Eric
dc.contributor.imecauthorBeyer, Gerald
dc.contributor.orcidimecDerakhshandeh, Jaber::0000-0003-2448-9165
dc.contributor.orcidimecBeyne, Eric::0000-0002-3096-050X
dc.date.accessioned2021-10-24T09:58:22Z
dc.date.available2021-10-24T09:58:22Z
dc.date.embargo9999-12-31
dc.date.issued2017
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/29059
dc.identifier.urlhttp://ieeexplore.ieee.org/document/7968962/
dc.source.beginpage1
dc.source.conferenceIEEE International Interconnect Technology Conference - IITC
dc.source.conferencedate16/07/2017
dc.source.conferencelocationHsinchu Taiwan
dc.source.endpage3
dc.title

Growth rate of IMC in the binary sytems of Co/Sn and Cu/Sn

dc.typeProceedings paper
dspace.entity.typePublication
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