Publication:

High-Performance Radiation-Hardened Spintronic Retention Latch and Flip-Flop for Highly Reliable Processors

Date

2021
Journal article
https://doi.org/10.1109/TDMR.2021.3074251
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dc.contributor.authorNair, Sarath Mohanachandran
dc.contributor.authorMayahinia, Mahta
dc.contributor.authorTahoori, Mehdi B.
dc.contributor.authorPerumkunnil, Manu
dc.contributor.authorZahedmanesh, Houman
dc.contributor.authorCroes, Kristof
dc.contributor.authorGarello, Kevin
dc.contributor.authorMarinelli, Tommaso
dc.contributor.authorEvenblij, Timon
dc.contributor.authorKar, Gouri Sankar
dc.contributor.authorCatthoor, Francky
dc.contributor.imecauthorPerumkunnil, Manu
dc.contributor.imecauthorZahedmanesh, Houman
dc.contributor.imecauthorCroes, Kristof
dc.contributor.imecauthorGarello, Kevin
dc.contributor.imecauthorEvenblij, Timon
dc.contributor.imecauthorKar, Gouri Sankar
dc.contributor.imecauthorCatthoor, Francky
dc.contributor.orcidimecCroes, Kristof::0000-0002-3955-0638
dc.contributor.orcidimecEvenblij, Timon::0000-0002-5337-0617
dc.contributor.orcidimecCatthoor, Francky::0000-0002-3599-8515
dc.contributor.orcidimecPerumkunnil, Manu::0000-0002-0029-6548
dc.contributor.orcidimecZahedmanesh, Houman::0000-0002-0290-691X
dc.date.accessioned2023-01-19T14:15:43Z
dc.date.available2021-11-02T16:01:10Z
dc.date.available2023-01-19T14:15:43Z
dc.date.issued2021
dc.identifier.doi10.1109/TDMR.2021.3074251
dc.identifier.issn1530-4388
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/37874
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
dc.source.beginpage258
dc.source.endpage266
dc.source.issue2
dc.source.journalIEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY
dc.source.numberofpages9
dc.source.volume21
dc.subject.keywordsELECTROMIGRATION
dc.title

High-Performance Radiation-Hardened Spintronic Retention Latch and Flip-Flop for Highly Reliable Processors

dc.typeJournal article
dspace.entity.typePublication
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