Publication:
Modeling Dark Current Degradation of Monolithic InGaAs/GaAs-On-Si Nano-Ridge Photodetectors
| dc.contributor.author | Hsieh, Ping-Yi | |
| dc.contributor.author | Ben Driss, Ameni | |
| dc.contributor.author | Tsiara, Artemisia | |
| dc.contributor.author | O'Sullivan, Barry | |
| dc.contributor.author | Yudistira, Didit | |
| dc.contributor.author | Kunert, Bernardette | |
| dc.contributor.author | Van Campenhout, Joris | |
| dc.contributor.author | De Wolf, Ingrid | |
| dc.contributor.imecauthor | Hsieh, Ping-Yi | |
| dc.contributor.imecauthor | Tsiara, Artemisia | |
| dc.contributor.imecauthor | O'Sullivan, Barry | |
| dc.contributor.imecauthor | Yudistira, Didit | |
| dc.contributor.imecauthor | Kunert, Bernardette | |
| dc.contributor.imecauthor | Van Campenhout, Joris | |
| dc.contributor.imecauthor | De Wolf, Ingrid | |
| dc.contributor.orcidimec | Hsieh, Ping-Yi::0000-0003-4173-3799 | |
| dc.contributor.orcidimec | Tsiara, Artemisia::0000-0002-5612-6468 | |
| dc.contributor.orcidimec | O'Sullivan, Barry::0000-0002-9036-8241 | |
| dc.contributor.orcidimec | Yudistira, Didit::0000-0003-1440-5407 | |
| dc.contributor.orcidimec | Kunert, Bernardette::0000-0002-8986-4109 | |
| dc.contributor.orcidimec | Van Campenhout, Joris::0000-0003-0778-2669 | |
| dc.contributor.orcidimec | De Wolf, Ingrid::0000-0003-3822-5953 | |
| dc.date.accessioned | 2025-06-05T14:16:30Z | |
| dc.date.available | 2024-08-16T18:28:43Z | |
| dc.date.available | 2025-06-05T14:16:30Z | |
| dc.date.issued | 2024 | |
| dc.description.wosFundingText | This work was supported by IMEC's industrial affiliation R&D program on Optical I/O. | |
| dc.identifier.doi | 10.1109/IRPS48228.2024.10529459 | |
| dc.identifier.eisbn | 979-8-3503-6976-2 | |
| dc.identifier.isbn | 979-8-3503-6977-9 | |
| dc.identifier.issn | 1541-7026 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/44326 | |
| dc.publisher | IEEE | |
| dc.source.conference | International Reliability Physics Symposium (IRPS) | |
| dc.source.conferencedate | APR 14-18, 2024 | |
| dc.source.conferencelocation | Grapevine | |
| dc.source.journal | N/A | |
| dc.source.numberofpages | 9 | |
| dc.subject.keywords | III-V | |
| dc.subject.keywords | RECOMBINATION | |
| dc.subject.keywords | PHOTODIODES | |
| dc.subject.keywords | RELAXATION | |
| dc.title | Modeling Dark Current Degradation of Monolithic InGaAs/GaAs-On-Si Nano-Ridge Photodetectors | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
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