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DIBL in enhanced dynamic threshold operation of UTBB SOI with different drain engineering at high temperatures

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dc.contributor.authorSasaki, Katia R.A.
dc.contributor.authorSimoen, Eddy
dc.contributor.authorClaeys, Cor
dc.contributor.authorMartino, Joao A.
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.accessioned2021-10-23T14:36:18Z
dc.date.available2021-10-23T14:36:18Z
dc.date.embargo9999-12-31
dc.date.issued2016
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/27268
dc.identifier.urlhttp://ieeexplore.ieee.org/document/7731329/
dc.source.beginpage1
dc.source.conference31st Symposium on Microelectronics Technology and Devices - SBMICRO
dc.source.conferencedate1/01/2016
dc.source.conferencelocationBrasilia Brazil
dc.source.endpage4
dc.title

DIBL in enhanced dynamic threshold operation of UTBB SOI with different drain engineering at high temperatures

dc.typeProceedings paper
dspace.entity.typePublication
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