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Impact of selective epitaxial growth and uniaxial/biaxial strain on DIBL effect using triple FinFETs
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Impact of selective epitaxial growth and uniaxial/biaxial strain on DIBL effect using triple FinFETs
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Date
2010
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
dos Santos, S.D.
;
Martino, J.A.
;
Simoen, Eddy
;
Claeys, Cor
Journal
Journal of Integrated Circuits and Systems
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1827
since deposited on 2021-10-18
Acq. date: 2025-12-12
Citations
Metrics
Views
1827
since deposited on 2021-10-18
Acq. date: 2025-12-12
Citations