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Confirmatory Methods Comparison for Measuring Latent Multidimensional Structures in Assessments

 
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cris.virtual.orcid0000-0001-6092-6655
cris.virtual.orcid0000-0003-4011-219X
cris.virtualsource.department85203c4f-4729-4dc0-bb8a-65d6481a9c0d
cris.virtualsource.department8754c9b2-916f-46f2-a722-ddca1779eb02
cris.virtualsource.orcid85203c4f-4729-4dc0-bb8a-65d6481a9c0d
cris.virtualsource.orcid8754c9b2-916f-46f2-a722-ddca1779eb02
dc.contributor.authorChen, Changsheng
dc.contributor.authorVan den Noortgate, Wim
dc.date.accessioned2026-07-27T09:03:06Z
dc.date.available2026-07-27T09:03:06Z
dc.date.createdwos2026
dc.date.issued2026
dc.description.abstractConfirming assumed latent multidimensional structures is a crucial step in developing assessment tools. This study compares three confirmatory methods (including CFA, CMIRT, and GDINA) and corresponding model-fit indices regarding confirming true structures over misspecified structures, based on 162,000 simulated binary data under between-item, within-item, bifactor, and two-tier structures. The results show that for model-fit indices, in CFA, AIC and BIC outperform others for two-tier and the other structures, respectively; in CMIRT, BIC and AIC perform better than others for between-item and the other structures, respectively; in GDINA, SRMSR and AIC outperform others for two-tier and the other structures, respectively. Regarding methods comparison, for between-item and within-item structures, CFA and CMIRT can be trusted more than GDINA; for two-tier structures, GDINA and CMIRT perform better than CFA; for bifactor structures, GDINA outperforms others. Given that none of them is optimal, we recommend using multiple methods as a kind of sensitivity analysis.
dc.description.wosFundingTextThe author(s) reported there is no funding associated with the work featured in this article.
dc.identifier.doi10.1080/08957347.2026.2691084
dc.identifier.eissn1532-4818
dc.identifier.issn0895-7347
dc.identifier.issn1532-4818
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/59983
dc.language.isoeng
dc.provenance.editstepusergreet.vanhoof@imec.be
dc.publisherROUTLEDGE JOURNALS, TAYLOR & FRANCIS LTD
dc.source.beginpage151
dc.source.endpage169
dc.source.issue1-2
dc.source.journalAPPLIED MEASUREMENT IN EDUCATION
dc.source.numberofpages19
dc.source.volume39
dc.subject.keywordsFIT INDEXES
dc.subject.keywordsMODEL
dc.subject.keywordsCRITERIA
dc.subject.keywordsPACKAGE
dc.subject.keywordsTRAIT
dc.title

Confirmatory Methods Comparison for Measuring Latent Multidimensional Structures in Assessments

dc.typeJournal article
dspace.entity.typePublication
imec.internal.crawledAt2026-06-24
imec.internal.sourcecrawler
imec.internal.wosCreatedAt2026-07-14
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