Publication:

Large-Signal Characterisation and Analysis of AlN/GaN MISHEMTs on Si with a PAE > 62% at 28 GHz

Date

2024
Proceedings Paper
https://doi.org/10.1109/ms40175.2024.10600314
Simple item page Full metadata Statistics
 
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.department#PLACEHOLDER_PARENT_METADATA_VALUE#
cris.virtual.orcid0000-0003-0769-7069
cris.virtual.orcid0000-0003-0576-4344
cris.virtual.orcid0000-0001-9166-4408
cris.virtual.orcid0009-0007-5368-306X
cris.virtual.orcid0000-0003-3463-416X
cris.virtual.orcid0000-0002-8062-3165
cris.virtual.orcid0000-0003-2892-3176
cris.virtual.orcid0000-0002-1976-0259
cris.virtual.orcid0000-0003-4530-2603
cris.virtual.orcid0000-0002-7581-870X
cris.virtualsource.department78f3a04c-1a79-488d-b3c6-436cafb31dd0
cris.virtualsource.departmentfe3b6e68-9f34-476c-b847-c72527808ecf
cris.virtualsource.department37e9b359-0d14-4379-bfa0-e5593f0acf46
cris.virtualsource.department08c9111d-32e4-4755-946d-58bda0110a33
cris.virtualsource.departmentfa867be9-6d43-441a-8209-5ffdc9d82a84
cris.virtualsource.departmentc807a03a-358d-4274-b622-dee889a60454
cris.virtualsource.department948aac93-47b8-4f21-8d0e-48fd52ec8746
cris.virtualsource.departmentea5b882a-5be3-4569-a1f6-206c7ee87e49
cris.virtualsource.departmenta2b73aca-98d9-4e61-96dd-b1d3c104ac04
cris.virtualsource.department5d12abec-29ff-4812-ab67-e957a23676cb
cris.virtualsource.orcid78f3a04c-1a79-488d-b3c6-436cafb31dd0
cris.virtualsource.orcidfe3b6e68-9f34-476c-b847-c72527808ecf
cris.virtualsource.orcid37e9b359-0d14-4379-bfa0-e5593f0acf46
cris.virtualsource.orcid08c9111d-32e4-4755-946d-58bda0110a33
cris.virtualsource.orcidfa867be9-6d43-441a-8209-5ffdc9d82a84
cris.virtualsource.orcidc807a03a-358d-4274-b622-dee889a60454
cris.virtualsource.orcid948aac93-47b8-4f21-8d0e-48fd52ec8746
cris.virtualsource.orcidea5b882a-5be3-4569-a1f6-206c7ee87e49
cris.virtualsource.orcida2b73aca-98d9-4e61-96dd-b1d3c104ac04
cris.virtualsource.orcid5d12abec-29ff-4812-ab67-e957a23676cb
dc.contributor.authorElKashlan, Rana Y.
dc.contributor.authorYadav, Sachin
dc.contributor.authorKhaled, Ahmad
dc.contributor.authorXiao, Dongping
dc.contributor.authorKazemi Esfeh, Babak
dc.contributor.authorYu, Hao
dc.contributor.authorAlian, AliReza
dc.contributor.authorPeralagu, Uthayasankaran
dc.contributor.authorCollaert, Nadine
dc.contributor.authorParvais, Bertrand
dc.contributor.imecauthorElKashlan, Rana
dc.contributor.imecauthorYadav, Sachin
dc.contributor.imecauthorKhaled, Ahmad
dc.contributor.imecauthorXiao, Dongping
dc.contributor.imecauthorYu, Hao
dc.contributor.imecauthorAlian, AliReza
dc.contributor.imecauthorPeralagu, Uthayasankaran
dc.contributor.imecauthorKazemi Esfeh, Babak
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.imecauthorParvais, Bertrand
dc.contributor.orcidimecElKashlan, Rana::0000-0003-0576-4344
dc.contributor.orcidimecYadav, Sachin::0000-0003-4530-2603
dc.contributor.orcidimecKhaled, Ahmad::0000-0003-2892-3176
dc.contributor.orcidimecXiao, Dongping::0000-0002-7581-870X
dc.contributor.orcidimecYu, Hao::0000-0002-1976-0259
dc.contributor.orcidimecAlian, AliReza::0000-0003-3463-416X
dc.contributor.orcidimecPeralagu, Uthayasankaran::0000-0001-9166-4408
dc.contributor.orcidimecKazemi Esfeh, Babak::0009-0007-5368-306X
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.contributor.orcidimecParvais, Bertrand::0000-0003-0769-7069
dc.date.accessioned2025-04-10T14:30:52Z
dc.date.available2024-09-17T18:00:18Z
dc.date.available2025-04-10T14:30:52Z
dc.date.issued2024
dc.identifier.doi10.1109/ms40175.2024.10600314
dc.identifier.eisbn979-8-3503-7504-6
dc.identifier.isbn979-8-3503-7505-3
dc.identifier.issn0149-645X
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/44515
dc.publisherIEEE
dc.source.beginpage948
dc.source.conferenceIEEE/MTT-S International Microwave Symposium (IMS)
dc.source.conferencedateJUN 16-21, 2024
dc.source.conferencelocationWashington
dc.source.endpage951
dc.source.journalN/A
dc.source.numberofpages4
dc.subject.keywordsDC-RF DISPERSION
dc.subject.keywordsALGAN/GAN
dc.title

Large-Signal Characterisation and Analysis of AlN/GaN MISHEMTs on Si with a PAE > 62% at 28 GHz

dc.typeProceedings paper
dspace.entity.typePublication
Files
Publication available in collections:
Conference contributions