Publication:
A physics-based VLSI interconnect model including substrate and conductor skin effects
Date
| dc.contributor.author | Ymeri, H. | |
| dc.contributor.author | Nauwelaers, Bart | |
| dc.contributor.author | Maex, Karen | |
| dc.contributor.author | De Roest, David | |
| dc.contributor.imecauthor | Nauwelaers, Bart | |
| dc.contributor.imecauthor | Maex, Karen | |
| dc.contributor.imecauthor | De Roest, David | |
| dc.date.accessioned | 2021-10-15T18:11:00Z | |
| dc.date.available | 2021-10-15T18:11:00Z | |
| dc.date.issued | 2004 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/9965 | |
| dc.source.beginpage | 516 | |
| dc.source.endpage | 518 | |
| dc.source.issue | 3 | |
| dc.source.journal | Semiconductor Science and Technology | |
| dc.source.volume | 19 | |
| dc.title | A physics-based VLSI interconnect model including substrate and conductor skin effects | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
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