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Depth profiling of Al2O3 + TiO2 nanolaminates by means of a time-of-flight energy spectrometer
Publication:
Depth profiling of Al2O3 + TiO2 nanolaminates by means of a time-of-flight energy spectrometer
Date
2011
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Laitinen, M.
;
Sajavaara, T.
;
Rossi, M.
;
Julin, J.
;
Puurunen, R.L.
;
Suni, T.
;
Ishida, T.
;
Fujita, H.
;
Brijs, Bert
;
Whitlow, H.J.
Journal
Nuclear Instruments and Methods in Physics Research B
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1856
since deposited on 2021-10-19
Acq. date: 2025-10-23
Citations
Metrics
Views
1856
since deposited on 2021-10-19
Acq. date: 2025-10-23
Citations