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Process optimization and improvement of contact hole CDU and pattern placement with grapho-epitaxy DSA with EUV patterned templates
Publication:
Process optimization and improvement of contact hole CDU and pattern placement with grapho-epitaxy DSA with EUV patterned templates
Date
2017
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Boeckx, Carolien
Journal
Abstract
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1892
since deposited on 2021-10-24
Acq. date: 2025-10-23
Citations
Metrics
Views
1892
since deposited on 2021-10-24
Acq. date: 2025-10-23
Citations